Metre (unit)/Bibliography: Difference between revisions
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imported>John R. Brews No edit summary |
imported>John R. Brews No edit summary |
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*{{cite journal |title=γ-ray wavelength as standard for atomic scales |url=http://hasyweb.desy.de/science/annual_reports/1999_report/part1/contrib/48/1051.pdf |journal=Phys Rev Lett |year=2000 |author=Yu V Shvyd'ko ''et al.'' |volume=vol 85 |pages=pp. 495-498 |doi= 10.1103/PhysRevLett.85.495}} | *Description of how the known silicon lattice spacing can be used to set up the wavelength of [[Mössbauer radiation]] as a convenient length standard at atomic scales. {{cite journal |title=γ-ray wavelength as standard for atomic scales |url=http://hasyweb.desy.de/science/annual_reports/1999_report/part1/contrib/48/1051.pdf |journal=Phys Rev Lett |year=2000 |author=Yu V Shvyd'ko ''et al.'' |volume=vol 85 |pages=pp. 495-498 |doi= 10.1103/PhysRevLett.85.495}} | ||
*An interesting discussion of interferometric methods and instruments. {{cite book |title=Optical shop testing |editor=Daniel Malacara, ed. |url=http://books.google.com/books?id=RME5F4bpjncC&pg=PA667|pages=pp. 667 ''ff'' |chapter=Chapter 15: Surface profilers, multiple wavelength, and white light interferometry |author=J Schmit, K Creath, and JC Wyant |isbn= 0471484040 |year=2007 |edition=3rd ed |publisher=Wiley-Interscience}} | |||
*A thorough discussion of metrology of the metre. {{cite book |title= Handbook of Laser Technology and Applications: Applications |chapter=Fundamental length metrology |author=J Flügge, F Riehle, and H Kunzmann |url=http://books.google.com/books?id=8wPekoJyfEUC&pg=PA1723 |pages=pp. 1723 ''ff'' |isbn=0750309660 |year=2004 |publisher=Taylor & Francis}} | |||
Revision as of 14:35, 9 April 2011
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- Description of how the known silicon lattice spacing can be used to set up the wavelength of Mössbauer radiation as a convenient length standard at atomic scales. Yu V Shvyd'ko et al. (2000). "γ-ray wavelength as standard for atomic scales". Phys Rev Lett vol 85: pp. 495-498. DOI:10.1103/PhysRevLett.85.495. Research Blogging.
- An interesting discussion of interferometric methods and instruments. J Schmit, K Creath, and JC Wyant (2007). “Chapter 15: Surface profilers, multiple wavelength, and white light interferometry”, Daniel Malacara, ed.: Optical shop testing, 3rd ed. Wiley-Interscience, pp. 667 ff. ISBN 0471484040.
- A thorough discussion of metrology of the metre. J Flügge, F Riehle, and H Kunzmann (2004). “Fundamental length metrology”, Handbook of Laser Technology and Applications: Applications. Taylor & Francis, pp. 1723 ff. ISBN 0750309660.